Figure 5 of Ziebarth, Mol Vis 2007; 13:504-510.

Figure 5. Analysis process for atomic force microscopy measurements

Force scans are taken by probing the sample with the cantilever and recording the cantilever deflection (upper panel). Force (in picoNewtons) versus indentation was derived from the cantilever spring constant and slope found during calibration (lower panel). Young's modulus was then calculated using the Hertz model.

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Ziebarth, Mol Vis 2007; 13:504-510 <>
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