Figure 3 of
Ziebarth, Mol Vis 2007;
13:504-510.Figure 3 of
Ziebarth, Mol Vis 2007;
13:504-510.
Figure 3. Location of the lens sample in the atomic force microscopy system
Location of the lens sample in the atomic force microscopy system. The lens sample is placed in a Petri dish filled with DMEM. The dish with the lens is then placed in the AFM system under a PMMA block that contains the AFM cantilever.
